Analog Models of Lithospheric‐Scale Rifting Monitored in an X‐Ray CT Scanner

Rifting and continental break-up are fundamental tectonic processes, the understanding of which is prime importance. However, vast temporal spatial scales involved pose major limitations to researchers. Analog modeling represents a great means mitigate these limitations, but studying complex internal deformation lithospheric-scale models remains challenge. We therefore present novel method for rifting that uniquely monitored in an X-ray CT scanner, combined with digital image correlation (DIC) techniques, provides unparalleled insights into model deformation. Our first illustrate how degree coupling between competent lithospheric layers, separated by weak lower crustal layer, strongly impacts rift system development. Low isolates upper crust from mantle layer below, preventing efficient transfer both layers. By contrast, fast increases coupling, so efficiently transferred crust, inducing either symmetric or asymmetric (double) system. Furthermore, oblique divergence may lead en echelon graben arrangements delayed exhumation layer. The successful application our approach, yielding first-order insights, clear incentive continue running models, apply advanced monitoring techniques extract as much information possible. There indeed broad range opportunities follow-up studies within (and beyond) field tectonics.